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昆山華乃爾精密儀器有限公司

Kunshan Huanair Precision Instrument Co.,Ltd.

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400-666-2286

Kunshan Huanair Precision Instrument Co.,Ltd.
Free Hotline: 400-666-2286
Tel: 086-512-5011-0876, 5011-2958
Fax: 086-512-5756-7135
Business Mobile: 139-6262-4628
E-mail: huanair@huanair.com
Address: 
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No. 588#,Jingtan Road, Bacheng Town, Kunshan City,Jiangsu,CHina

Microscope series BX41M-LED

Antistatic Olympus microscope BX41M-LED in anti-static, corresponding to the ESD microscope, using a long-life LED lighting. Reflection illumination device equipped with a regular and oblique illumination of the two models, simple operation oblique illumination and high-contrast image can be obtained.[Detailed]

BX51 microscope series

Olympus BX51 is a research-level upright microscope, cover all the way of seeing. UIS 2 with advanced optical system to provide superior optical image quality, wide field of view number PLAPON achromatic objective lens with aspherical condenser U-AAC combine to make all under magnification has excellent r…[Detailed]

Microscope series BX51M

Olympus BX51M scientific research level upright microscope, covering all way of seeing. UIS 2 with advanced optical system to provide superior optical image quality, wide field of view number PLAPON achromatic objective lens with aspherical condenser U-AAC combine to make all under magnification has excel…[Detailed]

Microscope MX51 series

Olympus MX51 industrial inspection microscope is a cost-effective microscope, which takes into account the inspection efficiency design, sharp image resolution and superior software solutions to help achieve a variety of attachments observation method for a variety of electronic components, wafers and lar…[Detailed]

BX51M-IR microscope series

BX51IR microscope to the naked eye is not visible to the area of inspection and non-destructive analysis, as well as near-infrared Chate appearance of a microscope. Can the rear surface of the semiconductor wafer and integrated circuit components inside the CPS bumps observed lossless.[Detailed]

Inverted Metallurgical Microscope

Stage microscope objective above. Applied science: mechanical engineering; optical instruments; microscope - a microscope name; the objective lens placed below the stage of an optical microscope. Suitable for culturing cells in microscopic observation and micromanipulation. Applied science: Cell biology; …[Detailed]

High-definition through reflection microscope MTH-501E

The trinocular through reflection optical microscope is suitable for small and inconvenient for inversion of the sample, and the need to find observational studies and analyze specific range of the target sample. Through reflection microscope equipped with epi-illuminator (coaxial reflection) and transmis…[Detailed]

Metallurgical testing microscope HN-MXD

Testing, LCD screen (LCD) detecting conductive particles (Conductive Particles) examination, laboratory analysis to detect the material mainly used in the field of semiconductor silicon wafers (Silicon Wafer) and other precision engineering, samples can be bright-field, dark field, differential interferen…[Detailed]

Large platform upright microscope

HN-201 series upright metallurgical microscope is suitable for microscopic observation of opaque objects. With wide range of mobile mechanical loading platform, Vertical illumination devices, built-in polarizing observation device, an image clarity, contrast is good, attractive appearance, easy to operate…[Detailed]

Large platform upright microscope

HN-101系列正置金相顯微鏡適用于對不透明物體的進行顯微觀察。配置大移動范圍的機械式載物臺、落射照明器、內置 偏光觀察裝置,具有圖像清晰、襯度好,造型美觀,操作方便等特點,是金屬學、礦物學、精密工程學、電子學等研究的理想 儀器。適用于學校、科研、工廠等部門使用。 [Detailed]

Inverted Metallurgical Microscope

HN-17 series metallurgical microscope is mainly used to identify and analyze the internal metal structure of the organization, an important tool for the study of metal metallurgical physics. This instrument is optional photographic device, you can take the desired microstructure map an integer multiple ph…[Detailed]

Through reflection optical microscope

HN-3030 through reflection microscope is suitable for microscopic observation of opaque objects or transparent objects. The instrument configuration epi-illumination system with the transmission, long-distance plan achromatic objectives (no cover glass), wide-field eyepieces and set polarizer device havin…[Detailed]
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